A. 期刊論文 1. Hsu, C.-Y., Lu, Y.-W., & Jiang, Y.-L. (2026). Small defect detection in panel display industry by faster region convolutional neural network with attentional feature fusion. Journal of the Chinese Institute of Engineers. https://doi.org/10.1080/02533839.2 |
| 2. Hsu, C. -Y., & Lu, Y. -W. (2025). Test-Time Feature Caching Network for cross-domain multilayer ceramic capacitors defect detection. Applied Soft Computing, 113380. (SCI) |
| 3. Lu, Y. -W., Wang, Y., Liu, X., Zhang, C., & Hsu, C. Y. (2025). Physics-Informed Machine Learning for Failure Mode Proportion Prediction in Composite Adhesive Joints. Journal of Manufacturing Science and Engineering, 147(8), 081007. (SCI) |
| 4. Hsu, C. -Y., & Lu, Y. W. (2023). Virtual metrology of material removal rate using a one-dimensional convolutional neural network-based bidirectional long short-term memory network with attention. Computers & Industrial Engineering, 186, 109701. (SCI) |
| 5. Hsu, C.-Y., Y.-W. Lu, & Yan, J.-H. (2022). Temporal Convolution-Based Long-Short Term Memory Network with Attention Mechanism for Remaining Useful Life Prediction. IEEE Transactions on Semiconductor Manufacturing, 35(2), 220-228. (SCI) |
B. 會議論文 1. Lu, Y.-W. & Hsu, C.-Y. (2025). Unsupervised Domain Adaptation for Defect Detection based on Test-Time Feature Caching Network and Empirical Study in Multilayer Ceramic Capacitors Manufacturing. 2025 IEEE 21st International Conference on Automation Science |
| 2. Lu, Y.-W. & Hsu, C.-Y. (2023). Contour-aware Generative Adversarial Network for Imbalanced Mask Defect Detection. The International Conference on Smart Manufacturing, Industrial & Logistics Engineering 2023. |
| 3. Lu, Y.-W., Jiang, Y.-L., & Hsu, C.-Y. (2022). Small Defect Inspection by a Two-step Object Detection and Classification Model. The 60th Chinese Institute of Industrial Engineers Annual Conference (CIIE 2022). |
| 4. Lu, Y.-W. & Hsu, C.-Y. (2021). Application of Virtual Metrology in Semiconductor Manufacturing by One-Dimensional Convolution Neural Network and Bi-Directional Long Short-Term Memory with Attention Mechanism. 2021 International Symposium of Quality Manage |
| 5. Lu, Y.-W. & Hsu, C.-Y. (2021). Semi-supervised Learning Framework for Defect Classification and Empirical Study. The 2021 IEEE International Conference on Automation Science and Engineering (CASE2021). |
| 6. Lu, Y.-W. & Hsu, C.-Y. (2020). Virtual Metrology for Prognostics and Health Management in Deep Learning. The 2020 Annual Meeting of the Operations Research Society of Taiwan (ORSTW). |
| 7. Lu, Y.-W., Liu, K.-L., & Hsu, C.-Y. (2019). Conditional generative adversarial network for defect classification with class imbalance. 2019 IEEE International Conference on Smart Manufacturing, Industrial & Logistics Engineering (SMILE2019), 146-149. |