Dr. Chen, Pei-Wen

PositionAssistant Professor, Yuan Ze University
Office2512R, Ext.2515
Laboratory(none)
E-Mailieiris@saturn.yzu.edu.tw
Personal Website(none)

Education

2010Ph.D., Industrial Engineering & Management, Yuan-Ze University , Taiwan
2004M.S., Industrial Engineering & Management, Yuan-Ze University , Taiwan
2002B.S., Mathematics, National Tsing-Hua University, Taiwan

Experience

2022.08-PresentAssistant Professor, Department of Industrial Engineering & Management, Yuan Ze University
2017.05-2022.07SHL Medical, Process Development Department, Principal Statistics Engineer
2016.04-2017.05 Micron Technology, Quality System Management Department, Principal Engineer
2015.02-2022.07 Adjunct Assistant Professor, Department of Industrial Engineering and Management, Yuan Ze University
2013.02-2016.04 Unimicron, Total Quality Management Department, Six Sigma, Senior Deputy Manager
2012.09-2013.02 POU CHEN GROUP IE Leader
2010.11-2012.02 InnoLux, Quality System Management Department, Senior Engineer
2008.02-2016.07Adjunct Lecturer, Department of Industrial Engineering and Management, Ming Chi University of Technology
2008.02-2010.02 Adjunct Lecturer, Department of Manufacturing Engineering and Technology, Yuan Ze University
2004.09-2005.02 Chunghwa Picture Tubes , Quality System Management Department, Engineer

Research & Interests

Statistical Process Control
Six Sigma
Data Analysis
Total Quality Management

Publications and Awards

Journal Papers

1.    Chuen-Sheng Cheng;Pei-Wen Chen;Yu-Tang Wu, Phase I Analysis of Nonlinear Profiles Using Anomaly Detection Techniques, Applied Sciences, Vol.13, No.4, pp 2147~2147( 2023/02 )

2.    Chuen-Sheng Cheng;Pei-Wen Chen;Yu-Chin Hsieh;Yu-Tang Wu, Multivariate Process Control Chart Pattern Classification Using Multi-Channel Deep Convolutional Neural Networks, Mathematics, Vol.11, No.15, pp 3291~3291( 2023/07 )

3.    Cheng, C. S., Chen, P. W., and Ho, Y., 2022, Concurrent control chart pattern classification using multi-label convolutional neural networks, Applied Sciences, 12(2), 787. (SCI, IF 2.679)

4.    Chen, P. W., Peng, W. S., Cheng, C. S. and Wang, Y. T., 2017, Monitoring of nonlinear profile variations using support vector machines, Journal of Quality, 24(5), 313-323. (EI). (ANQ Special Issue)

5.    Cheng, C. S., Huang, K. K. and Chen, P. W., 2015, Recognition of control chart patterns using a neural network-based pattern recognizer with features extracted from correlation analysis, Pattern Analysis and Applications, 18(1), 75-86. (SCI, IF 2.124).

6.    Chen, P. W., Huang, K. K., Lee, Y. L. and Cheng, C. S., 2015, A support vector regression based control procedure for detecting a range of unknown mean shifts. Journal of Quality, 22(5), 427-440. (EI). (ISQM Special Issue)

7.    Chen, P. W., Cheng, C. S. and Chen, S. J., 2012, Increasing the sensitivity of cumulative quality control charts for monitoring high-yield process with runs rules, Journal of Quality, 19(5), 405-422. (EI) (ANQ Special Issue)

8.    Cheng, C. S., Lee, T. C. and Chen, P. W., 2012, Using neural network to predict current gain of III-V compound semiconductor epitaxy wafer, Journal of Quality, 19(4), 405-422. (EI)

9.    Cheng, C. S., Chen, P. W., Lee, S. C., and Huang, K. K., 2012, The application of design for six sigma on high level smart phone development, Journal of Quality, 19(2), 117-136. (EI)

10.    Cheng, C. S. and Chen, P. W., 2011, An ARL-unbiased design of time-between-events control charts with runs rules, Journal of Statistical Computation and Simulation, 81(7), 857-871. (SCI, IF 1.424)

11.    Cheng, C. S., Chen, P. W. and Huang, K. K., 2011, Estimating the shift size in the process mean with support vector regression and neural networks, Expert Systems with Applications, 38(8), 10624-10630. (SCI, IF 6.954)

12.    Chen, P. W. and Cheng, C. S., 2011, On statistical design of the cumulative quantity control chart for monitoring high yield processes, Communications in Statistics-Theory and Methods, 40(11), 1911-1928. (SCI, IF 0.893).

13.    Chen, P. W. and Cheng, C. S., 2010, An ARL-unbiased approach to setting control limits of CCC-r chart for high-yield processes, Journal of Quality, 17(6), 435-452. (EI)

Conference Papers

1.    Cheng, C. S., Chen, P. W., Ho, Y., 2017, Monitoring fraction nonconforming with X bar and R charts - an application to substrate manufacturing process, in Proceedings of the 53th Annual Conference of Chinese Society for Quality and 2017 International Symposium of Quality Management, November 25, Taoyuan, Taiwan.

2.    Chen, P. W., Cheng, C. S., Peng, W. S. and Wang, Y. T., 2015, Monitoring of nonlinear profile variations using support vector machines. in Proceedings of ANQ Congress 2015.

3.    Huang, K. K., Cheng, C. S., Chen, P. W., Hsu, M. S. and Chiang, M. J., 2012, Identifying the process status change using independent component analysis and support vector machine, in Proceedings of ANQ Congress 2012, August 1-2, Hong Kong, China.

4.    Cheng, C. S., Chen, P. W., Huang, K. K., and Lee, H. T., 2011, Combining ICA and MEWMA for monitoring between-part and within-part variation of product measurements, in Proceedings of ANQ Congress 2011, Sep, 26-30, Ho Chi Minh City, Vietnam.

5.    Chen, P. W., Cheng, C. S., Hsu, Y. H., and Chen, S. S., 2009, A study on the optimal setting of control limits for CCC-r chart in monitoring high-yield processes, in Proceedings of The 7th Asian Quality Congress, September 15-18, Tokyo, Japan.

6.    Cheng, C. S., and Chen, P. W., 2009, On the statistical design of time-between-events charts with runs rules, in Proceedings The 7th Asian Quality Congress, September 15-18, Tokyo, Japan.

7.    Cheng, C. S., and Chen, P. W., 2009, Enhancing the cumulative count of conforming chart with runs rules, in Proceedings of the 2nd International Symposium of Quality Management, November 6-7, Taipei, Taiwan.

8.    Cheng, C. S., and Chen, P. W., 2008, The design of cumulative count of conforming chart with supplementary runs rules, in Proceedings of the 9th Asia Pacific Industrial Engineering and Management Conference, December 3-5, Bali, Indonesia.

9.    Cheng, C. S., and Chen, P. W., 2007, A modified control scheme for fraction nonconforming under Markov dependent processes, in Proceedings The 8th Asia Pacific Industrial Engineering and Management Conference, December 9-12, Kaohsiung, Taiwan.

10.    Cheng, C. S., and Chen, P. W., 2007, Cumulative count of conforming chart with variable sampling intervals for Markov dependent production processes, in Proceedings the 2nd International Conference on Innovative Computing, Information and Control, September 5-7, Kumamoto, Japan.

11.    Cheng, C. S., and Chen, P. W., 2005, The development of attributes control chart for high-yield process, in Proceedings the 6th Asia Pacific Industrial Engineering and Management Conference, December 4-7, Manila, Philippines.